Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11454949 | Auto-correlation of wafer characterization data and generation of composite wafer metrics during semiconductor device fabrication | Shivam Agarwal, Hariharasudhan Koteeswaran, Priyank Paras Jain, Yuan Zhong | 2022-09-27 |