Issued Patents All Time
Showing 51–55 of 55 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4842408 | Phase shift measuring apparatus utilizing optical meterodyne techniques | Noriyuki Nose, Yukichi Niwa, Yoshimichi Okada | 1989-06-27 |
| 4804831 | Focus detecting apparatus independent of object image contrast | Takashi Baba, Yukichi Niwa, Takako Watanabe | 1989-02-14 |
| 4788596 | Image stabilizing device | Eigo Kawakami, Yukichi Niwa, Mitsutoshi Ohwada, Yasuo Ogino, Shigeyuki Suda | 1988-11-29 |
| 4780739 | Anti-vibration imaging device | Eigo Kawakami, Yukichi Niwa, Yasuo Ogino, Shigeyuki Suda, Mitsutoshi Ohwada | 1988-10-25 |
| 4641962 | Aberration measuring method | Tetsuo Sueda | 1987-02-10 |