Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8164345 | Spectral and information theoretic method of test point, partial-scan, and full-scan flip-flop insertion to improve integrated circuit testability | Michael L. Bushnell, Raghuveer Ausoori, Omar B. Khan, Deepak Mehta | 2012-04-24 |
| 7702980 | Scan-load-based dynamic scan configuration | — | 2010-04-20 |
| 7535297 | Architecture and method for improving efficiency of a class-A power amplifier by dynamically scaling biasing current thereof as well as synchronously compensating gain thereof in order to maintain overall constant gain of the class-A power amplifier at all biasing configurations thereof | Yanbo Tian, Norman Scheinberg | 2009-05-19 |
| 6922800 | Test sequences generated by automatic test pattern generation and applicable to circuits with embedded multi-port RAMs | Joseph C. Watkins | 2005-07-26 |
| 6618826 | Test sequences generated by automatic test pattern generation and applicable to circuits with embedded multi-port RAMs | Joseph C. Watkins | 2003-09-09 |