Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8164345 | Spectral and information theoretic method of test point, partial-scan, and full-scan flip-flop insertion to improve integrated circuit testability | Michael L. Bushnell, Omar B. Khan, Deepak Mehta, Xinghao Chen | 2012-04-24 |