Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8279409 | System and method for calibrating a lithography model | Abdurrahman Sezginer, Hsu-Ting Huang, Tatung Chow, Kostyantyn Chuyeshov, Gokhan Percin | 2012-10-02 |
| 7849423 | Method of verifying photomask data based on models of etch and lithography processes | Bayram Yenikaya, Devendra Joshi, Paul A. Fornari, Abdurrahman Sezginer | 2010-12-07 |
| 7600212 | Method of compensating photomask data for the effects of etch and lithography processes | Franz Zach, Bayram Yenikaya, Gokhan Percin, Xuelong Cao, Abdurrahman Sezginer | 2009-10-06 |