Issued Patents All Time
Showing 76–100 of 102 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10274798 | Black matrix structure and manufacturing method thereof, array substrate, color filter substrate and display apparatus | Hongming Zhan, Lifeng Lin, Xibin Shao, Woong-Kwon Kim, Zhanchang Bu +2 more | 2019-04-30 |
| 10217391 | Shift register unit, gate driving circuit and driving method thereof, and display apparatus | Guangliang Shang, Xing Yao, Seungwoo Han, Yujie Gao, Yuanbo Zhang +2 more | 2019-02-26 |
| 10203444 | Display apparatus | Jinku Lv, Xue Dong, Zhanchang Bu, Bochang Wang, Yutao Hao +3 more | 2019-02-12 |
| 9612481 | Display substrate, method for manufacturing the same, and liquid crystal display device | Hongming Zhan, Xiong Jin | 2017-04-04 |
| 8627258 | Adjusting capacitance of capacitors without affecting die area | Peter CY Huang | 2014-01-07 |
| 8627259 | Capacitance modification without affecting die area | Peter CY Huang | 2014-01-07 |
| 8255858 | Method for adjusting capacitance of capacitors without affecting die area | Peter CY Huang | 2012-08-28 |
| 7477631 | Method of controlling signal transmission in a local area network | Wuo-Hui Chu, Tsung-Hsien Chen | 2009-01-13 |
| 6603559 | Silicon-on-insulator optical waveguide Michelson interferometer sensor for temperature monitoring | Shyh-Lin Tsao, Shin-Ge Lee, Peng-Chun Peng | 2003-08-05 |
| 6185511 | Method to accurately determine classification codes for defects during semiconductor manufacturing | Paul J. Steffan | 2001-02-06 |
| 6174738 | Critical area cost disposition feedback system | Paul J. Steffan | 2001-01-16 |
| 6154711 | Disposition tool for factory process control | Paul J. Steffan | 2000-11-28 |
| 6098024 | System for process data association using LaPlace Everett interpolation | Paul J. Steffan | 2000-08-01 |
| 6055437 | Dynamic allocation of communication resources | Ralph G. Riley | 2000-04-25 |
| 6041270 | Automatic recipe adjust and download based on process control window | Paul J. Steffan | 2000-03-21 |
| 6035244 | Automatic defect reclassification of known propagator defects | Paul J. Steffan | 2000-03-07 |
| 6011619 | Semiconductor wafer optical scanning system and method using swath-area defect limitation | Paul J. Steffan, Bryan Tracy | 2000-01-04 |
| 5999003 | Intelligent usage of first pass defect data for improved statistical accuracy of wafer level classification | Paul J. Steffan | 1999-12-07 |
| 5972728 | Ion implantation feedback monitor using reverse process simulation tool | Paul J. Steffan | 1999-10-26 |
| 5966459 | Automatic defect classification (ADC) reclassification engine | Paul J. Steffan | 1999-10-12 |
| 5946213 | Intelligent adc reclassification of previously classified propagator defects | Paul J. Steffan | 1999-08-31 |
| 5917332 | Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer | Yung-Tao Lin | 1999-06-29 |
| 5905434 | Vehicle communication device | Paul J. Steffan | 1999-05-18 |
| 5896294 | Method and apparatus for inspecting manufactured products for defects in response to in-situ monitoring | Wanyee A. Chow, Yung-Tao Lin, Ying Shiau | 1999-04-20 |
| 5866437 | Dynamic process window control using simulated wet data from current and previous layer data | Paul J. Steffan | 1999-02-02 |