ML

Melisa Luca

AB Asml Netherlands B.V.: 1 patents #2,025 of 3,192Top 65%
Lam Research: 1 patents #1,364 of 2,128Top 65%
Overall (All Time): #2,735,234 of 4,157,543Top 70%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11048174 Method of controlling a patterning process, lithographic apparatus, metrology apparatus lithographic cell and associated computer program Michael Kubis, Marinus Jochemsen, Richard S. Wise, Nader Shamma, Girish Dixit +3 more 2021-06-29