AC

Alek Chi-Heng Chen

AB Asml Netherlands B.V.: 4 patents #960 of 3,192Top 35%
EI Electronic Systems Integration: 1 patents #1 of 10Top 10%
LS Loral Federal Systems: 1 patents #4 of 22Top 20%
NU National Taiwan University: 1 patents #729 of 2,195Top 35%
📍 New Taipei, NY: #37 of 56 inventorsTop 70%
Overall (All Time): #842,271 of 4,157,543Top 25%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
9541500 Method for calibrating a manufacturing process model Kuen-Yu Tsai, Jia Li 2017-01-10
8945800 Method of preparing a pattern, method of forming a mask set, device manufacturing method and computer program Tsann-Bim Chiou, Mircea Dusa 2015-02-03
7713682 Substrate, method of exposing a substrate, machine readable medium 2010-05-11
7582413 Substrate, method of exposing a substrate, machine readable medium 2009-09-01
6717685 In situ proximity gap monitor for lithography 2004-04-06
5504793 Magnification correction for 1-X proximity X-Ray lithography 1996-04-02