Reginald Hunter — 25 Patents at Applied Materials

Reginald Hunter has been granted 25 US patents while listed as an inventor at Applied Materials. The first was granted in 1993 and the most recent in June 2011. Reginald Hunter ranks #158,593 of 4,157,543 US inventors in our database (top 3.8%). Patent records list Reginald Hunter in Austin, TX, US.

Issued Patents All Time

Showing 1–25 of 25 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
7969465	Method and apparatus for substrate imaging	Don Batson	2011-06-28	$3,915,000
7434485	Sensor device for non-intrusive diagnosis of a semiconductor processing system	—	2008-10-14	$28,572,000
7331250	Sensor device for non-intrusive diagnosis of a semiconductor processing system	—	2008-02-19	$32,891,000
7012684	Method and apparatus to provide for automated process verification and hierarchical substrate examination	—	2006-03-14	$17,746,000
6895831	Sensor device for non-intrusive diagnosis of a semiconductor processing system	—	2005-05-24	$9,995,000
6882416	Methods for continuous embedded process monitoring and optical inspection of substrates using specular signature analysis	Eduardo Marquis	2005-04-19	$20,507,000
6878636	Method for enhancing substrate processing	Joel Brad Bailey	2005-04-12	$15,186,000
6813032	Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques	—	2004-11-02	$17,088,000
6805137	Method for removing contamination particles from substrates	Joel Brad Bailey	2004-10-19	$52,625,000
6803998	Ultra low cost position and status monitoring using fiber optic delay lines	Joel Brad Bailey	2004-10-12	$28,243,000
6779226	Factory interface particle removal platform	Joel Brad Bailey	2004-08-24	$49,482,000
6725564	Processing platform with integrated particle removal system	Joel Brad Bailey	2004-04-27	$41,702,000
6721045	Method and apparatus to provide embedded substrate process monitoring through consolidation of multiple process inspection techniques	—	2004-04-13	$29,327,000
6707545	Optical signal routing method and apparatus providing multiple inspection collection points on semiconductor manufacturing systems	—	2004-03-16	$48,208,000
6707544	Particle detection and embedded vision system to enhance substrate yield and throughput	Sagie Tsadka	2004-03-16	$48,208,000
6697517	Particle detection and embedded vision system to enhance substrate yield and throughput	—	2004-02-24	$43,513,000
6693708	Method and apparatus for substrate surface inspection using spectral profiling techniques	—	2004-02-17	$39,298,000
6684523	Particle removal apparatus	Joel Brad Bailey, Steven Gianoulakis	2004-02-03	$30,271,000
6677166	Method for confirming alignment of a substrate support mechanism in a semiconductor processing system	—	2004-01-13	$26,561,000
6642853	Movable wireless sensor device for performing diagnostics with a substrate processing system	—	2003-11-04	$60,533,000
6630995	Method and apparatus for embedded substrate and system status monitoring	—	2003-10-07	$183,148,000
6468816	Method for sensing conditions within a substrate processing system	—	2002-10-22	$32,970,000
6244121	Sensor device for non-intrusive diagnosis of a semiconductor processing system	—	2001-06-12	$57,514,000
6026896	Temperature control system for semiconductor processing facilities	—	2000-02-22	$181,242,000
5260563	Compact laser warning receiver	Gerald D. Powell, Ronald E. Ham, Joseph Lenhardt, Thomas G. Ratliff	1993-11-09	$1,347,000

Reginald Hunter — 25 Patents

Issued Patents All Time

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