Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10522327 | Method of operating a charged particle beam specimen inspection system | Gilad Erel, Stefan Lanio | 2019-12-31 |
| 10056228 | Charged particle beam specimen inspection system and method for operation thereof | Gilad Erel, Stefan Lanio | 2018-08-21 |
| 7659506 | Method and system for generating and reviewing a thin sample | Jacob Levin, Dror Shemesh | 2010-02-09 |