Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10522327 | Method of operating a charged particle beam specimen inspection system | Michal Avinun-Kalish, Stefan Lanio | 2019-12-31 |
| 10056228 | Charged particle beam specimen inspection system and method for operation thereof | Michal Avinun-Kalish, Stefan Lanio | 2018-08-21 |