Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12211195 | Edge defect detection via image analytics | Yash Chhabra, Abyaya Dhar, Joseph Liu, Yi Nung Wu, Boon Sen Chan +1 more | 2025-01-28 |
| 12136225 | Clog detection via image analytics | Yash Chhabra, Abyaya Dhar, Boon Sen Chan, Yenwei Hung, Sidda Reddy Kurakula +1 more | 2024-11-05 |