Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12211195 | Edge defect detection via image analytics | Yash Chhabra, Abyaya Dhar, Joseph Liu, Yi Nung Wu, Boon Sen Chan +1 more | 2025-01-28 |
| 12136225 | Clog detection via image analytics | Yash Chhabra, Abyaya Dhar, Boon Sen Chan, Yenwei Hung, Chandrasekhar Roy +1 more | 2024-11-05 |
| 10854433 | In-situ real-time plasma chamber condition monitoring | Tzu-Yen Hsieh | 2020-12-01 |