Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12211195 | Edge defect detection via image analytics | Yash Chhabra, Abyaya Dhar, Joseph Liu, Boon Sen Chan, Sidda Reddy Kurakula +1 more | 2025-01-28 |
| 11898245 | High throughput and metal contamination control oven for chamber component cleaning process | Chien-Min Liao, Chi-Feng Liu, Hsiu Yang, Yixing Lin, Boon Sen Chan +1 more | 2024-02-13 |