Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12170849 | Pulsed illumination for fluid inspection | — | 2024-12-17 |
| 12135296 | Edge inspection of silicon wafers by image stacking | — | 2024-11-05 |
| 12128446 | High speed substrate sorter | Markus J. Stopper | 2024-10-29 |
| 12131930 | Inspection system | Markus J. Stopper | 2024-10-29 |
| 12046498 | Method and apparatus for continuous substrate cassette loading | Markus J. Stopper | 2024-07-23 |
| 12007334 | Compact apparatus for batch vial inspection | — | 2024-06-11 |
| 11945660 | Linear sorter using vacuum belt | Markus J. Stopper | 2024-04-02 |
| 11733178 | Method and system for inspection of products | — | 2023-08-22 |
| 11688618 | Method and apparatus for continuous substrate cassette loading | Markus J. Stopper | 2023-06-27 |
| 11264263 | Conveyor inspection system, substrate rotator, and test system having the same | Markus J. Stopper | 2022-03-01 |
| 11072502 | Substrate tilt control in high speed rotary sorter | Markus J. Stopper | 2021-07-27 |
| 10937683 | Conveyor inspection system, substrate rotator, and test system having the same | Markus J. Stopper | 2021-03-02 |
| 10777436 | High speed rotary sorter | Markus J. Stopper | 2020-09-15 |
| 10507991 | Vacuum conveyor substrate loading module | Markus J. Stopper | 2019-12-17 |
| 10406562 | Automation for rotary sorters | Markus J. Stopper | 2019-09-10 |
| 10403533 | Substrate rotary loader | Markus J. Stopper | 2019-09-03 |
| 9754365 | Wafer inspection method and software | Markus J. Stopper | 2017-09-05 |
| 9341580 | Linear inspection system | Shengde Zhong | 2016-05-17 |
| 8902428 | Process and apparatus for measuring the crystal fraction of crystalline silicon casted mono wafers | Amir Al-Bayati | 2014-12-02 |
| 8225496 | Automated integrated solar cell production line composed of a plurality of automated modules and tools including an autoclave for curing solar devices that have been laminated | Robert Z. Bachrach, Yong Kee Chae, Soo Young Choi, Nicholas G. J. de Vries, Yacov Elgar +22 more | 2012-07-24 |
| 8111390 | Method and apparatus for residue detection in the edge deleted area of a substrate | Kenneth Tsai | 2012-02-07 |