Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
MN

Megumi Nakamura — 23 Patents

ANAnelva: 9 patents #10 of 280Top 4%
Canon: 9 patents #6,770 of 19,416Top 35%
IBM: 2 patents #32,909 of 70,183Top 50%
HHHitachi High-Technologies: 2 patents #1,236 of 1,200Top 105%
TCToshiba Battery Co.: 1 patents #88 of 145Top 65%
Kawasaki, JP: #1,086 of 15,035 inventorsTop 8%
Overall (All Time): #178,160 of 4,157,543Top 5%
23 Patents All Time
Megumi Nakamura has been granted 23 US patents while listed as an inventor at Anelva. The first was granted in 2002 and the most recent in September 2024. Megumi Nakamura ranks #178,160 of 4,157,543 US inventors in our database (top 4.3%). Patent records list Megumi Nakamura in Kawasaki, JP.

Patents per Year

Patents granted per year, 2002 to 2024Bar chart with a peak of 4 patents in 2003.peak 42002: 1 patents20022003: 4 patents2004: 1 patents20042006: 3 patents2007: 1 patents20072011: 2 patents2012: 4 patents20122013: 3 patents2016: 1 patents20162017: 1 patents2023: 1 patents20232024: 1 patents2024

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12080511 Sample holder, method for using sample holder, projection amount adjustment jig, projection amount adjustment method and charged particle beam device Hisayuki Takasu, Kento HORINOUCHI 2024-09-03
11742178 Ion milling device and milling processing method using same Hitoshi Kamoshida, Hisayuki Takasu, Atsushi Kamino, Shota AIDA 2023-08-29
9697998 Mass spectrometer Yoshiyuki Takizawa, Masayuki Sugiyama, Yuji Shimada, Hiroki Mita 2017-07-04
9373491 Mass spectrometer Masayuki Sugiyama, Lei Chen, Yoshiyuki Takizawa 2016-06-21 $40,000
8436295 Device for measuring mean free path, vacuum gauge, and method for measuring mean free path Yoshiro Shiokawa, Qiang Peng 2013-05-07 $74,000
8410415 Ion detector for mass spectrometry, method for detecting ion, and method for manufacturing ion detector Yoshiro Shiokawa, Qiang Peng 2013-04-02 $69,000
8386211 Monitoring virtual worlds to detect events and determine their type Mika Saito, Shoko Suzuki 2013-02-26 $4,239,000
8324568 Mass spectrometer and mass spectrometry method Yoshiro Shiokawa, Yoshiki Hirano, Yasuyuki Taneda, Qiang Peng, Harumi Maruyama 2012-12-04 $100,000
8309917 Mass spectrometry and mass spectrometer used for the same Yoshiro Shiokawa, Harumi Maruyama, Yasuyuki Taneda 2012-11-13 $91,000
8164051 Internal standard material, resin composition, and measurement method Yoshiro Shiokawa, Harumi Maruyama 2012-04-24 $93,000
8137203 System and method for virtual space-hazard assessment Mika Saito 2012-03-20 $2,170,000
8049166 Mass spectrometer system and mass spectrometry method Yoshiro Shiokawa, Harumi Maruyama 2011-11-01 $259,000
7952069 Mass spectrometer and mass spectrometry method Yoshiro Shiokawa, Harumi Maruyama, Aiko Wada 2011-05-31 $217,000
7202474 Ion attachment mass spectrometry apparatus Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama 2007-04-10
7084397 Ion attachment mass spectrometry apparatus Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama 2006-08-01
7015461 Method and apparatus for ion attachment mass spectrometry Yoshiro Shiokawa, Tohru Sasaki, Toshihiro Fujii 2006-03-21
7005634 Ionization apparatus Yoshiro Shiokawa, Tohru Sasaki, Toshihiro Fujii 2006-02-28
6800848 Method and apparatus for ion attachment mass spectrometry Yoshiro Shiokawa, Tohru Sasaki, Toshihiro Fujii 2004-10-05
6635868 Mass spectrometry apparatus Yoshiro Shiokawa, Toshihiro Fujii 2003-10-21
6590205 Ionization method for mass spectrometry and mass spectrometry apparatus Yoshiro Shiokawa, Tohru Sasaki, Toshihiro Fujii 2003-07-08
6559443 Ionization apparatus and ionization method for mass spectrometry Yoshiro Shiokawa, Yoshiki Hirano, Toshihiro Fujii 2003-05-06
D468198 Front surface of package Manami Nakazawa, Miki Suzuki 2003-01-07
6479814 Ion source for ion attachment mass spectrometry apparatus Yoshiro Shiokawa, Toshihiro Fujii 2002-11-12