Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12080511 | Sample holder, method for using sample holder, projection amount adjustment jig, projection amount adjustment method and charged particle beam device | Megumi Nakamura, Hisayuki Takasu | 2024-09-03 |
| 10269534 | Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device | Toru Iwaya, Hisayuki Takasu, Sakae Koubori, Atsushi Kamino | 2019-04-23 |
| 9761412 | Ion milling apparatus and sample processing method | Atsushi Kamino, Toru Iwaya, Hisayuki Takasu | 2017-09-12 |