YS

Yoshiro Shiokawa

AN Anelva: 21 patents #2 of 280Top 1%
Canon: 8 patents #7,260 of 19,416Top 40%
Overall (All Time): #132,367 of 4,157,543Top 4%
29
Patents All Time

Issued Patents All Time

Showing 1–25 of 29 patents

Patent #TitleCo-InventorsDate
8436295 Device for measuring mean free path, vacuum gauge, and method for measuring mean free path Megumi Nakamura, Qiang Peng 2013-05-07
8410415 Ion detector for mass spectrometry, method for detecting ion, and method for manufacturing ion detector Megumi Nakamura, Qiang Peng 2013-04-02
8324568 Mass spectrometer and mass spectrometry method Yoshiki Hirano, Megumi Nakamura, Yasuyuki Taneda, Qiang Peng, Harumi Maruyama 2012-12-04
8309917 Mass spectrometry and mass spectrometer used for the same Harumi Maruyama, Yasuyuki Taneda, Megumi Nakamura 2012-11-13
8164051 Internal standard material, resin composition, and measurement method Harumi Maruyama, Megumi Nakamura 2012-04-24
8049166 Mass spectrometer system and mass spectrometry method Megumi Nakamura, Harumi Maruyama 2011-11-01
7952069 Mass spectrometer and mass spectrometry method Megumi Nakamura, Harumi Maruyama, Aiko Wada 2011-05-31
7842919 Q-pole type mass spectrometer 2010-11-30
7202474 Ion attachment mass spectrometry apparatus Yoshiki Hirano, Harumi Maruyama, Megumi Nakamura 2007-04-10
7164121 Ion attachment mass spectrometry method Yoshiki Hirano 2007-01-16
7084397 Ion attachment mass spectrometry apparatus Yoshiki Hirano, Harumi Maruyama, Megumi Nakamura 2006-08-01
7015461 Method and apparatus for ion attachment mass spectrometry Megumi Nakamura, Tohru Sasaki, Toshihiro Fujii 2006-03-21
7005634 Ionization apparatus Megumi Nakamura, Tohru Sasaki, Toshihiro Fujii 2006-02-28
6800848 Method and apparatus for ion attachment mass spectrometry Megumi Nakamura, Tohru Sasaki, Toshihiro Fujii 2004-10-05
6800850 Reflection type ion attachment mass spectrometry apparatus Yoshiki Hirano 2004-10-05
6768108 Ion attachment mass spectrometry apparatus, ionization apparatus, and ionization method Yoshiki Hirano, Toshihiro Fujii, Munetaka Nakata, Masao Takayanagi 2004-07-27
6635868 Mass spectrometry apparatus Megumi Nakamura, Toshihiro Fujii 2003-10-21
6590205 Ionization method for mass spectrometry and mass spectrometry apparatus Megumi Nakamura, Tohru Sasaki, Toshihiro Fujii 2003-07-08
6559443 Ionization apparatus and ionization method for mass spectrometry Megumi Nakamura, Yoshiki Hirano, Toshihiro Fujii 2003-05-06
6507020 Halide compound mass spectrometry method and mass spectrometry apparatus Toshihiro Fujii 2003-01-14
6479814 Ion source for ion attachment mass spectrometry apparatus Megumi Nakamura, Toshihiro Fujii 2002-11-12
6399213 Surface treated vacuum material and a vacuum chamber having an interior surface comprising same 2002-06-04
6316052 Method for the surface treatment of vacuum materials and surface treated vacuum 2001-11-13
5916388 Method and apparatus for the treatment of stainless steel surfaces 1999-06-29
4785173 Element analyzing apparatus 1988-11-15