Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10823759 | Test system and method of testing a wafer for integrated circuit devices | Lik Huay Lim, Andy Widjaja, King Yon Lew, Mohsen H. Mardi | 2020-11-03 |
| 10783308 | Method of assigning contact elements associated with an integrated circuit device | Lik Huay Lim, Andy Widjaja, King Yon Lew, Mohsen H. Mardi | 2020-09-22 |