WC

Wonhui Cho

AM AMD: 2 patents #3,994 of 9,279Top 45%
📍 Cedar Park, TX: #605 of 1,158 inventorsTop 55%
🗺 Texas: #52,441 of 125,132 inventorsTop 45%
Overall (All Time): #2,202,938 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6572443 Method and apparatus for detecting a process endpoint Peter J. Beckage, Keith A. Edwards, Ralf B. Lukner 2003-06-03
6179688 Method and apparatus for detecting the endpoint of a chemical-mechanical polishing operation Peter J. Beckage, Keith A. Edwards, Ralf B. Lukner 2001-01-30