WC

Wonhui Cho

AM AMD: 2 patents #3,994 of 9,279Top 45%
Overall (All Time): #2,202,938 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6572443 Method and apparatus for detecting a process endpoint Peter J. Beckage, Keith A. Edwards, Ralf B. Lukner 2003-06-03
6179688 Method and apparatus for detecting the endpoint of a chemical-mechanical polishing operation Peter J. Beckage, Keith A. Edwards, Ralf B. Lukner 2001-01-30