Issued Patents All Time
Showing 26–45 of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8269516 | High-speed contactor interconnect with circuitry | David M. Mahoney | 2012-09-18 |
| 8269519 | Methods and apparatus for testing of integrated circuits | — | 2012-09-18 |
| 7888954 | Method of utilizing an interposer in an automated test system and an automated test system having an interposer | — | 2011-02-15 |
| 7837481 | Socket for an integrated circuit and a method of providing a connection in a socket | David M. Mahoney | 2010-11-23 |
| 7737439 | Semiconductor component having test pads and method and apparatus for testing same | Jae-Weon Cho, Xin Wu, Chih-Chung Wu, Shih-Liang Liang, Sanjiv Stokes +1 more | 2010-06-15 |
| 7598727 | Probe card head protection device for wafer sort set up | Elvin P. Dang | 2009-10-06 |
| 7535239 | Probe card configured for interchangeable heads | Elvin P. Dang | 2009-05-19 |
| 7381908 | Circuit board stiffener | Cosimo Cantatore, David M. Mahoney | 2008-06-03 |
| 7352197 | Octal/quad site docking compatibility for package test handler | David M. Mahoney | 2008-04-01 |
| 7285973 | Methods for standardizing a test head assembly | David M. Mahoney | 2007-10-23 |
| 7235412 | Semiconductor component having test pads and method and apparatus for testing same | Jae-Weon Cho, Xin Wu, Chih-Chung Wu, Shih-Liang Liang, Sanjiv Stokes +1 more | 2007-06-26 |
| 7180318 | Multi-pitch test probe assembly for testing semiconductor dies having contact pads | David M. Mahoney | 2007-02-20 |
| 7138811 | Seals used for testing on an integrated circuit tester | David M. Mahoney | 2006-11-21 |
| 7083428 | Hybrid interface apparatus for testing integrated circuits having both low-speed and high-speed input/output pins | David M. Mahoney | 2006-08-01 |
| 6958616 | Hybrid interface apparatus for testing integrated circuits having both low-speed and high-speed input/output pins | David M. Mahoney | 2005-10-25 |
| 6891384 | Multi-socket board for open/short tester | Joseph M. Juane | 2005-05-10 |
| 6809524 | Testing of conducting paths using a high speed I/O test package | Brian M. Sadler, David M. Mahoney | 2004-10-26 |
| 6674036 | Method for marking packaged integrated circuits | — | 2004-01-06 |
| 6541991 | Interface apparatus and method for testing different sized ball grid array integrated circuits | Eric D. Hornchek | 2003-04-01 |
| 6359248 | Method for marking packaged integrated circuits | — | 2002-03-19 |