Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6046796 | Methodology for improved semiconductor process monitoring using optical emission spectroscopy | Richard J. Markle, Chris A. Nauert, Yi Cheng, Richard Bruce Patty | 2000-04-04 |
| 6013574 | Method of forming low resistance contact structures in vias arranged between two levels of interconnect lines | Fred N. Hause, Kuang-Yeh Chang | 2000-01-11 |