Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 6046796 | Methodology for improved semiconductor process monitoring using optical emission spectroscopy | Richard J. Markle, Chris A. Nauert, Yi Cheng, Richard Bruce Patty | 2000-04-04 | $6,962,000 |
| 6013574 | Method of forming low resistance contact structures in vias arranged between two levels of interconnect lines | Fred N. Hause, Kuang-Yeh Chang | 2000-01-11 | $7,165,000 |