CB

Carol M. Bradway

AM AMD: 2 patents #3,994 of 9,279Top 45%
🗺 Texas: #52,441 of 125,132 inventorsTop 45%
Overall (All Time): #2,192,589 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6759179 Methods and systems for controlling resist residue defects at gate layer in a semiconductor device manufacturing process Khoi A. Phan, Jeffrey P. Erhardt, Jerry Cheng, Richard Bartlett, Anthony P. Coniglio +3 more 2004-07-06
6649525 Methods and systems for controlling resist residue defects at gate layer in a semiconductor device manufacturing process Khoi A. Phan, Jeffrey P. Erhardt, Jerry Cheng, Richard Bartlett, Anthony P. Coniglio +3 more 2003-11-18