Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12272189 | Autonomous driving system component fault prediction | David B. Glasco, Daniel W. Bailey | 2025-04-08 |
| 11640733 | Autonomous driving system component fault prediction | David B. Glasco, Daniel W. Bailey | 2023-05-02 |
| 9903913 | Scan or JTAG controllable capture clock generation | Anirudh Kadiyala, Bill K. C. Kwan, Venkat K Kuchipudi | 2018-02-27 |
| 9436567 | Memory bit MBIST architecture for parallel master and slave execution | Archana Somachudan | 2016-09-06 |
| 9291676 | Scan warmup scheme for mitigating di/dt during scan test | Aditya Jagirdar, Bikash Agarwal, Eric C. Quinnell | 2016-03-22 |
| 9046574 | Test circuit having scan warm-up | Grady L. Giles, James A. Wingfield | 2015-06-02 |
| 9024650 | Scalable built-in self test (BIST) architecture | Archana Somachudan | 2015-05-05 |
| 9009552 | Scan-based reset | Bill K. C. Kwan, Amit Raj Pandey, Venkat K Kuchipudi, Aditya Jagirdar | 2015-04-14 |
| 8887012 | Method and apparatus for saving and restoring soft repair data | Bill K. C. Kwan, Norm Hack, David A. Kaplan | 2014-11-11 |
| 8694842 | Configurable Mux-D scan flip-flop design | Anirudh Kadiyala, Aditya Jagirdar | 2014-04-08 |
| 8661302 | Enhanced debug/test capability to a core reset process | Salih Hamid, Amit Raj Pandey, William Yang | 2014-02-25 |
| 8633725 | Scan or JTAG controllable capture clock generation | Anirudh Kadiyala, Bill K. C. Kwan, Venkat K Kuchipudi | 2014-01-21 |
| 7681099 | Techniques for integrated circuit clock signal manipulation to facilitate functional and speed test | Tendy The, Daniel W. Bailey, Bill K. C. Kwan | 2010-03-16 |