Issued Patents All Time
Showing 26–43 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7504639 | Ion sources, systems and methods | John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill | 2009-03-17 |
| 7495232 | Ion sources, systems and methods | John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill | 2009-02-24 |
| 7488952 | Ion sources, systems and methods | John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Lars Markwort +1 more | 2009-02-10 |
| 7485873 | Ion sources, systems and methods | John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger +3 more | 2009-02-03 |
| 7414243 | Transmission ion microscope | — | 2008-08-19 |
| 7368727 | Atomic level ion source and method of manufacture and operation | — | 2008-05-06 |
| 7321118 | Scanning transmission ion microscope | — | 2008-01-22 |
| 7094312 | Focused particle beam systems and methods using a tilt column | Charles J. Libby | 2006-08-22 |
| 6497194 | Focused particle beam systems and methods using a tilt column | Charles J. Libby | 2002-12-24 |
| 6039000 | Focused particle beam systems and methods using a tilt column | Charles J. Libby | 2000-03-21 |
| 5155368 | Ion beam blanking apparatus and method | David Edwards | 1992-10-13 |
| 5034612 | Ion source method and apparatus | Randall G. Percival | 1991-07-23 |
| 4976843 | Particle beam shielding | David Edwards, Robert A. Casella | 1990-12-11 |
| 4874947 | Focused ion beam imaging and process control | Michael Ward | 1989-10-17 |
| 4673101 | Evacuable chamber enclosing | Nicholas Guarino, Gabriel Onorio | 1987-06-16 |
| 4639301 | Focused ion beam processing | John A. Doherty, David C. Shaver | 1987-01-27 |
| 4433384 | Pattern data handling system for an electron beam exposure system | Donald W. Berrian | 1984-02-21 |
| 4424450 | Hybrid moving stage and rastered electron beam lithography system employing approximate correction circuit | William Wells | 1984-01-03 |