Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7700491 | Stringer elimination in a BiCMOS process | Milton Beachy, Daniel Charles Kerr, Thomas M. Oberdick, Mario Pita | 2010-04-20 |
| 7074628 | Test structure and method for yield improvement of double poly bipolar device | Bradley Albers, Daniel Charles Kerr, Edward P. Martin, Jr., Oliver D. Patterson | 2006-07-11 |
| 6406999 | Semiconductor device having reduced line width variations between tightly spaced and isolated features | Nace Layadi, Sylvia Marci Luque, Simon John Molloy, Mario Pita | 2002-06-18 |
| 6395639 | Process for improving line width variations between tightly spaced and isolated features in integrated circuits | Nace Layadi, Sylvia Marci Luque, Simon John Molloy, Mario Pita | 2002-05-28 |
| 5955381 | Integrated circuit fabrication | Donald S. Bitting, David Huibregtse, Paul Wheeler | 1999-09-21 |