Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6225639 | Method of monitoring a patterned transfer process using line width metrology | Thomas E. Adams, Scott Jessen, John M. McIntosh, Catherine Vartuli | 2001-05-01 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6225639 | Method of monitoring a patterned transfer process using line width metrology | Thomas E. Adams, Scott Jessen, John M. McIntosh, Catherine Vartuli | 2001-05-01 |