Partial year: Data through Q3 2025 (Sept 30). Full-year totals not yet available.
CS

Chi-Yuan Sun

TSMC: 1 patents #2,025 of 3,957Top 55%
📍 New Taipei, TW: #553 of 1,581 inventorsTop 35%
Overall (2025): #421,958 of 469,880Top 90%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12196687 Method for inspecting pattern defects Ju-Ying CHEN, Che-Yen Lee, Chia-Fong Chang, Hua-Tai Lin, Te-Chih Huang +1 more 2025-01-14