Partial year: Data through Q3 2025 (Sept 30). Full-year totals not yet available.
JC

Ju-Ying CHEN

TSMC: 1 patents #2,025 of 3,957Top 55%
Overall (2025): #330,078 of 469,880Top 75%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12196687 Method for inspecting pattern defects Che-Yen Lee, Chia-Fong Chang, Hua-Tai Lin, Te-Chih Huang, Chi-Yuan Sun +1 more 2025-01-14