Issued Patents 2025
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12374588 | Method for evaluating non-uniform stress | Wei-De Ho, Han-Wei Wu, Pei-Sheng TANG, Meng-Jung Lee, Szu-Ping Tung +1 more | 2025-07-29 |
| 12362180 | Method of manufacturing semiconductor devices | Chin-Ta Chen, Han-Wei Wu, Jiann Yuan Huang | 2025-07-15 |
| 12315737 | Feature patterning using pitch relaxation and directional end-pushing with ion bombardment | Tzung-Hua Lin, Yi-Ko CHEN, Chia-Chu Liu | 2025-05-27 |
| 12308233 | Dual critical dimension patterning | Kuo-Chang Kau, Wen-Yun Wang, Chia-Chu Liu | 2025-05-20 |
| 12196687 | Method for inspecting pattern defects | Ju-Ying CHEN, Che-Yen Lee, Chia-Fong Chang, Te-Chih Huang, Chi-Yuan Sun +1 more | 2025-01-14 |