Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196687 | Method for inspecting pattern defects | Ju-Ying CHEN, Che-Yen Lee, Chia-Fong Chang, Hua-Tai Lin, Chi-Yuan Sun +1 more | 2025-01-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196687 | Method for inspecting pattern defects | Ju-Ying CHEN, Che-Yen Lee, Chia-Fong Chang, Hua-Tai Lin, Chi-Yuan Sun +1 more | 2025-01-14 |