Issued Patents 2025
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12403360 | Intelligent exercise intensity assessing system and assessing method thereof | Chao-Chuan Chen, Han-Pin Ho, Jong-Shyan Wang, Chi-Yao Chiang, Yu-Liang Lin | 2025-09-02 |
| 12320493 | Flexible warning light | Chao-Ching Liu, Yi-Ting Huang, Wen-Bin Lo, Shuo-Ying Yen | 2025-06-03 |
| 12313675 | Method and device for wafer-level testing | Jun He, Wei-Hsun Lin, Yung-Liang Kuo, Yinlung Lu | 2025-05-27 |
| 12317482 | Semiconductor structure and method of manufacturing the same including buried word lines of different widths | — | 2025-05-27 |
| 12300729 | Low resistant contact method and structure | Yu-Sheng Wang | 2025-05-13 |
| 12270852 | Method and system for wafer-level testing | Jun He, Wei-Hsun Lin, Yung-Liang Kuo, Yinlung Lu | 2025-04-08 |
| 12265119 | Repackaging IC chip for fault identification | Chien-Yi Chen, Kao-Chih Liu, Chia-Hong Lin, Min-Feng Ku | 2025-04-01 |
| 12245421 | Semiconductor device with bit line contacts of different pitches | HUEI-RU LIN | 2025-03-04 |
| 12230450 | Semiconductor structure | Mao-Ying Wang | 2025-02-18 |
| 12219709 | Forming trench in IC chip through multiple trench formation and deposition processes | Kao-Chih Liu, Wenmin Hsu, Chia-Hong Lin, ChienYi Chen | 2025-02-04 |
| 12198991 | Test structure for use in dynamic random access memory and manufacturing method thereof | Chiang-Lin Shih, Hsueh-Han Lu | 2025-01-14 |
| 12191199 | Contact metallization process | Tien-Pei Chou, Ken-Yu Chang, Sheng-Hsuan Lin, Yueh-Ching Pai | 2025-01-07 |