Issued Patents 2025
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422245 | Semiconductor measurement apparatus | Garam Choi, Jinseob Kim, Jinyong Kim, Sungho Jang, Younguk JIN +1 more | 2025-09-23 |
| 12405226 | Substrate inspection apparatus and substrate inspection method | Jangwoon Sung, Lei Tian, Hao Wang, Jiabei Zhu, Myungjun Lee +3 more | 2025-09-02 |
| 12347096 | Semiconductor measurement apparatus | Myungjun Lee, Jinseob Kim, Jinyong Kim, Jaehwang Jung, Sungho Jang | 2025-07-01 |
| 12228499 | Pupil ellipsometry measurement apparatus and method and method of fabricating semiconductor device using the pupil ellipsometry measurement method | Jaehwang Jung, Yasuhiro Hidaka, Mitsunori Numata, Jinseob Kim, Myungjun Lee | 2025-02-18 |
| 12222282 | Semiconductor measurement apparatus | Seoyeon Jeong, Seungwoo Lee, Inho Andy Shin, Myungjun Lee, Jaehwang Jung | 2025-02-11 |