Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12412727 | Charged particle beam system, corrector for aberration correction of a charged particle beam, and method thereof | John Breuer | 2025-09-09 |
| RE50540 | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope | Jacob Pieter Hoogenboom, Nalan Liv Hamarat | 2025-08-19 |
| 12362131 | Method for inspecting a specimen and charged particle beam device | Ron Naftali, Jürgen Frosien, Ralf Schmid, Benjamin John Cook, Roman Barday +1 more | 2025-07-15 |
| 12224152 | Multi-beam charged particle source with alignment means | — | 2025-02-11 |