Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362131 | Method for inspecting a specimen and charged particle beam device | Pieter Kruit, Ron Naftali, Ralf Schmid, Benjamin John Cook, Roman Barday +1 more | 2025-07-15 |
JF
Jürgen Frosien
Technische Universiteit Delft: 1 patents #2 of 21Top 10%
Overall (2025): #329,681 of 469,880Top 75%
1
Patents 2025