Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE50540 | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope | Nalan Liv Hamarat, Pieter Kruit | 2025-08-19 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE50540 | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope | Nalan Liv Hamarat, Pieter Kruit | 2025-08-19 |