Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12412727 | Charged particle beam system, corrector for aberration correction of a charged particle beam, and method thereof | Pieter Kruit | 2025-09-09 |
| 12386164 | Method of determining a brightness of a charged particle beam, method of determining a size of a source of the charged particle beam, and charged particle beam imaging device | Dominik Ehberger, Matthias Firnkes | 2025-08-12 |
| 12308203 | Methods of determining aberrations of a charged particle beam, and charged particle beam system | Dominik Ehberger | 2025-05-20 |