Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379668 | Methods and systems for measurement of semiconductor structures with multi-pass statistical optimization | Daniel J. Haxton | 2025-08-05 |
| 12320763 | Full beam metrology for x-ray scatterometry systems | Antonio Arion Gellineau, Thaddeus Gerard Dziura, Andrei Veldman, Sergey Zalubovsky | 2025-06-03 |