Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320763 | Full beam metrology for x-ray scatterometry systems | Antonio Arion Gellineau, Thaddeus Gerard Dziura, John J. Hench, Andrei Veldman | 2025-06-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320763 | Full beam metrology for x-ray scatterometry systems | Antonio Arion Gellineau, Thaddeus Gerard Dziura, John J. Hench, Andrei Veldman | 2025-06-03 |