Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360062 | Methods and systems for regularizing the optimization of application specific semiconductor measurement system parameter settings | Christopher Liman, Bindi M. Nagda | 2025-07-15 |
| 12320763 | Full beam metrology for x-ray scatterometry systems | Thaddeus Gerard Dziura, John J. Hench, Andrei Veldman, Sergey Zalubovsky | 2025-06-03 |