Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379668 | Methods and systems for measurement of semiconductor structures with multi-pass statistical optimization | John J. Hench | 2025-08-05 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379668 | Methods and systems for measurement of semiconductor structures with multi-pass statistical optimization | John J. Hench | 2025-08-05 |