Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12406826 | Charged particle beam device and sample observation method | Daisuke Bizen, Yasuhiro Shirasaki, Yohei Nakamura, Satoshi Takada | 2025-09-02 |
| 12394041 | System for deriving electrical characteristics and non-transitory computer-readable medium | Heita Kimizuka, Yohei Nakamura, Muneyuki Fukuda | 2025-08-19 |
| 12196802 | Semiconductor inspection device and method for inspecting semiconductor sample | Yasuhiro Shirasaki, Minami Shouji, Makoto Sakakibara, Satoshi Takada | 2025-01-14 |