Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394586 | Charged particle beam device | Momoyo Enyama, Hajime Kawano, Makoto Suzuki, Kenji Tanimoto, Yuko Sasaki | 2025-08-19 |
| 12205790 | Charged particle beam device | Momoyo Enyama, Hajime Kawano, Hiroya Ohta | 2025-01-21 |
| 12196802 | Semiconductor inspection device and method for inspecting semiconductor sample | Yasuhiro Shirasaki, Natsuki Tsuno, Minami Shouji, Satoshi Takada | 2025-01-14 |