Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196802 | Semiconductor inspection device and method for inspecting semiconductor sample | Yasuhiro Shirasaki, Natsuki Tsuno, Makoto Sakakibara, Satoshi Takada | 2025-01-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196802 | Semiconductor inspection device and method for inspecting semiconductor sample | Yasuhiro Shirasaki, Natsuki Tsuno, Makoto Sakakibara, Satoshi Takada | 2025-01-14 |