Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12406826 | Charged particle beam device and sample observation method | Natsuki Tsuno, Yasuhiro Shirasaki, Yohei Nakamura, Satoshi Takada | 2025-09-02 |
| 12191111 | Charged particle beam system and method for determining observation conditions in charged particle beam device | Fumiya Ishizaka, Makoto Suzuki | 2025-01-07 |