Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12321102 | Machine and deep learning methods for spectra-based metrology and process control | Barak Bringoltz, Ran YACOBY, Noam Tal, Shay Yogev, Boaz STURLESI | 2025-06-03 |
| 12288228 | Edge bidding system for online ads | Justin Yoo Choi, Marcelo Muniz | 2025-04-29 |
| 12236364 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2025-02-25 |