Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12469124 | Machine learning based yield prediction | Boris Levant, Noam Tal, Lilach Choona, Shaul Pres, Jasmin Sonia Linshiz +2 more | 2025-11-11 |
| 12321102 | Machine and deep learning methods for spectra-based metrology and process control | Barak Bringoltz, Noam Tal, Shay Yogev, Boaz STURLESI, Oded Cohen | 2025-06-03 |