Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12321102 | Machine and deep learning methods for spectra-based metrology and process control | Ran YACOBY, Noam Tal, Shay Yogev, Boaz STURLESI, Oded Cohen | 2025-06-03 |
| 12236364 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Yongha Kim, ARIEL BROITMAN +5 more | 2025-02-25 |