Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12236364 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Noam Tal, Barak Bringoltz, Yongha Kim, ARIEL BROITMAN +5 more | 2025-02-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12236364 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Noam Tal, Barak Bringoltz, Yongha Kim, ARIEL BROITMAN +5 more | 2025-02-25 |