Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12416868 | Non-correctable error in metrology | Arie Van Den Brin | 2025-09-16 |
| 12287582 | Method for controlling a lithographic apparatus and associated apparatuses | Frank Staals | 2025-04-29 |
| 12197136 | Method of determining control parameters of a device manufacturing process | Wim Tjibbo Tel, Mark John Maslow, Koenraad VAN INGEN SCHENAU, Patrick Warnaar, Abraham SLACHTER +3 more | 2025-01-14 |